Semiconductor Materials And Characterization
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Follow on Instagram for UpdatesSemiconductor Materials And Characterization Syllabus — Unit-wise Content
The official GTU curriculum for Semiconductor Materials And Characterization (subject code ME01096041) as prescribed for EACD · Semester 1 divides the course into 6 units, covering 36 listed topics. The unit-wise breakdown below is read from the GTU syllabus document for this subject code, so you can check what the course actually covers before deciding which papers to attempt.
Download the official syllabus PDF (ME01096041)Unit 1 Resistivity
- Two-point Vs Four-point probe
- Wafer Mapping
- Resistivity profiling
- contactless methods
- strengths and weakness
Unit 2 Carrier and Doping Density
- measurement errors and Precautions
- Hall effect
- optical techniques
- secondary Ion Mass spectrometry
- Rutherford backscattering
- lateral profiling
- strengths and weakness Program Name: Master of Engineering Level: PG Branch: Electronics And Communication (VLSI Design) Subject Code: ME01096041 Subject Name: Semiconductor Materials and Characterization
Unit 3 Contact Resistance and Schottky Barrier
- metal- semiconductor contacts
- contact resistance
- measurement techniques
- Schottky barrier heights
- comparison of methods
- strengths and weakness
Unit 4 Series Resistance, Channel Length, and Width, and Threshold
- Voltage: Introduction
- PN junction diodes
- Schottky Barrier diodes
- solar cells, BJT, MOSFET
- MESFETs & MODFETs
- threshold voltage
- pseudo MOSFET
- strength and weakness
Unit 5 Charge-based and Probe Characterization
- surface charging
- The Kelvin Probe
- Scanning probe microscopy
- strength and weakness
Unit 6 Optical Characterization
- optical microscopy
- light scattering
- modulation spectroscopy
- line width
- Raman spectroscopy
- strengths and weaknesses. 7 15 Recent Development in Data Analytics (Study from latest research papers published in Scopus indexed/web of science journals - 04 hours during laboratory hours)
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