Metrology and Computer Aided Inspection
Get the full GTU study material, English & Gujarati textbook PDFs, syllabus curriculum, and solved previous year question papers.
English Book & Chapters
English Book Coming Soon
We are working hard to add this material. Stay tuned for updates!
Follow on Instagram for UpdatesGTU Previous Year Papers
Metrology and Computer Aided Inspection Syllabus — Unit-wise Content
The official GTU curriculum for Metrology and Computer Aided Inspection (subject code 2143402) as prescribed for Manufacturing · Semester 4 divides the course into 5 units, covering 12 listed topics. The unit-wise breakdown below is read from the GTU syllabus document for this subject code, so you can check what the course actually covers before deciding which papers to attempt.
Download the official syllabus PDF (2143402)Unit 1 BASIC CONCEPTS OF MEASUREMENTS
- Need for measurement – Dimensional and Form tolerances – Precision and Accuracy –Errors in Measurements – Causes – Types – Handling of measuring instruments –Maintenance of Instruments – Standards and Practice – Metrology lab – Environment and conditions
Unit 2 LINEAR AND ANGULAR MEASUREMENTS
- Measurement of Engineering Components – Comparators
- Slip gauges
- Limit gauges – Design and Applications – Angle dekkor – Alignment telescope – Sine bar –Bevel protractors – Types – Principle – Applications
Unit 3 FORM MEASUREMENTS
- Measurement of Screw thread and gears – Radius measurement – Surface finish measurement – Auto collimator – Straightness
- Flatness and roundness measurements– Principles – Application
Unit 4 OPTICAL MEASUREMENTS
- Optical microscope
- interference microscope
- Tool makers microscope
- Vision systems
- Precision instrument based on Laser – Use of Lasers – Principle – Laser Interferometer– Application in Linear and Angular measurements – Testing of machine tools using Laser Interferometer
Unit 5 ADVANCES IN METROLOGY
- Co-ordinate measuring machine – Constructional features – Types – Applications of CMM – CNC CMM applications – Computer Aided Inspection – Machine Vision –Applications in Metrology.Nanometrology – Introduction – Principles – Nanometer metrology systems – Methods of measuring length and surfaces to nano scale result with interferometers and other devices
Study on Android App:
